yieldWerx – Explainer Video Script
In the semiconductor industry, ramping new products to market and minimizing yield loss are major concerns. But many companies spend more time trying to capture and track data than they do actually analyzing the data, solving problems, and implementing fixes. What’s needed is a true end-to-end solution that leverages cross-operational test data, and leads to real yield-boosting results, ramping your product to market faster and allowing engineers to do their jobs more efficiently. Welcome to yieldWerx. yieldWerx captures data from and seamlessly integrates with test equipment and processes from inline parametric, WAT / PCM, wafer probe, and final test to capture data and generate insightful reports to assist with yield analysis. It’s used by engineers in many settings, including fabless design houses, test equipment manufacturers, waferfabs, and test-houses. With yieldWerx, fab lot data can be traced from beginning to end, allowing teams to pinpoint trouble spots and identify where greater process control and improvements are needed. yieldWerx can handle any test-related data elements such as images, fail memory, inspection data, and MES data. This clear and complete yield analysis helps boost efficiency, and allows teams to spend less time chasing information, and more time actually solving problems. The result is improved operational efficiency, higher device quality, and minimized yield loss… with the ultimate goal of achieving a zero-defect product. Find out why clients say we’re a “trusted partner” that performs “better than the competition.” Signup for a live online demo with a yieldWerx technical expert today! YieldWerx Semiconductor – End-to-end test data intelligence.